应bevictor伟德国际刘兴光老师邀请，南安普顿大学汪煜博士近日来公司进行讲学活动，欢迎校内师生参加。
报告题目：结构光与机器学习辅助的超分辨成像与计量
报告时间：2024年7月11日（星期四），下午15:30-17:00
报告地点：理学楼202
报告摘要：Optical nanometrology and nanoimaging have emerged as critical domains in understanding and manipulating matters at the nanoscale, which employs light as information carrier to insight properties of objects, such as morphology, dimensions, and positions. In this presentation, we explore the structured light assisted by machine learning algorithms in localization and imaging of sub-wavelength objects with super-resolution, far beyond the diffraction limit in conventional microscopy. Here the measured objects are super sensitive to the specific structured field with giant phase gradients resulting in significant variation of scattering patterns, beneficial for machine learning analysis to achieve precise measurements. Such non-invasive and label-free metrology with negligible errors down to a few nanometers, opens a range of opportunities for smart manufacturing processes, quality control, and advanced materials characterization.
报告人简介：汪煜，英国南安普顿大学光电子研究中心(Optoelectronics Research Centre)博士，师从英国皇家学会会员及美国国家工程院院士Prof. Nikolay I. Zheludev及EPSRC Nanostructured Photonic Metamaterials项目主持者Dr. Bruce (Jun-Yu) Ou, 主要从事结构光三维纳米成像与计量、超材料等相关研究，成果发表在Advanced Science, Applied Physics Letters, Photonics Research, Optics Express等学术期刊。2019年毕业于华南理工大学，师从国家杰青李志远教授及“广东千百十人才培养工程”梁文耀教授。其在本硕期间获国家奖学金、国家励志奖学金、华南理工大学优秀员工干部、华南理工大学优秀毕业生等荣誉。
